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    Home»Tech News»Configuring and controlling complex test equipment setups for silicon device test and characterization
    Tech News

    Configuring and controlling complex test equipment setups for silicon device test and characterization

    Ironside NewsBy Ironside NewsSeptember 25, 2025No Comments1 Min Read
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    On this webinar, we are going to discover environment friendly, correct, and scalable methods for analog and mixed-signal machine testing utilizing reconfigurable take a look at setups. As semiconductor units develop extra complicated, engineers face the problem of validating efficiency and catching edge circumstances below tight schedules. Take a look at setups typically embrace oscilloscopes, waveform mills, community analyzers, and extra, probably from completely different distributors with distinctive automation and configuration concerns. To be able to maintain tempo with semiconductor validation necessities, multi-channel take a look at setups designed for flexibility and efficiency may also help engineers scale successfully.

    Key learnings:

    • Decreasing sign path complexity with a number of built-in devices
    • Enhancing information constancy when measuring mixed-signal DUT response
    • Constructing environment friendly parallel take a look at setups to extend throughput
    • Configuring instance take a look at setups for widespread semiconductor validation checks



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